Product
WDM test system
Wavelength(nm) | 1260~1360/1520~1630 |
Max Working Station | 16 |
Max Channels each working Station | 12/24/36/48/64 |
Wavelength Resolution (pm) | 1 |
Wavelength Accuracy (pm) | 5 |
Sweep Repeatability (dB) | 0.02 |
PDL Repeatability(dB) | 0.02 |
Test Linearly(dB) | 0.04dB (+3~-50dBm) 0.3dB (-50~-65dBm) |
Optical Input Range(dBm) | +10~-70 |
Test Uncertainty(dB) | 5% |
Sweep Time(s) | <13s@100nm with PDL <6 s@100nm without PDL |
Control interface | Ethernet |
Power Supply | 110VAC/220VAC 50HZ |
Working temperature (℃) | -10~+40 |
Storage temperature (℃) | -25~+70 |
Dimension(mm) | 300x340x160 |
Other | 2/4/8/16/48/64 channel CWDM/DWDM/LANWDM Test System,1 TO16 Working Station , Muller Matrix PDL test。 |
CWDM Channel MUX/DEMUX
1 to N ,Muller Matrix PDL test
Less than 13s with PDL test
Less than 6s without PDL test